Share Email Print
cover

Proceedings Paper

Evaluation of the Compton camera method for spectroscopic imaging with ambient-temperature detector technology
Author(s): Jonathan R. D. Earnhart; Thomas H. Prettyman; Kiril D. Ianakiev; Robin P. Gardner
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A prototype Compton camera using ambient-temperature semiconductor detectors is developed for gamma ray spectroscopic imaging. Two camera configurations are evaluated, one using an intrinsic silicon detector for the front plane detector and the other using a CdZnTe detector for the front plane. Both configurations use a large-volume coplanar grid CdZnTe detector for the back plane. The effect of detector noise, energy resolution, and timing resolution on camera performance is described. Technical issues underlying the development of Compton cameras for spectroscopic imaging are presented and imaging of radioactive sources is demonstrated.

Paper Details

Date Published: 1 October 1999
PDF: 12 pages
Proc. SPIE 3769, Penetrating Radiation Systems and Applications, (1 October 1999); doi: 10.1117/12.363668
Show Author Affiliations
Jonathan R. D. Earnhart, Los Alamos National Lab. and North Carolina State Univ. (United States)
Thomas H. Prettyman, Los Alamos National Lab. (United States)
Kiril D. Ianakiev, Los Alamos National Lab. (United States)
Robin P. Gardner, North Carolina State Univ. (United States)


Published in SPIE Proceedings Vol. 3769:
Penetrating Radiation Systems and Applications
F. Patrick Doty, Editor(s)

© SPIE. Terms of Use
Back to Top