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Proceedings Paper

Superpolishing and precision metrology on a metal mandrel and replicated segments for Constellation-X
Author(s): David A. Content; Timo T. Saha; Robert Petre; James J. Lyons; Geraldine A. Wright; John J. Zaniewski; Kai-Wing Chan
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Paper Abstract

We have superpolished a diamond-turned aluminum mandrel to an axial roughness of 0.34 nm rms. The mandrel is made to the Astro-E secondary mirror design for the 81st shell. Precision metrology at 100 mm to submicron scales has established the power spectral density of the mandrel and ultralightweight gold coated replicated segments. Predicted image quality of a set of optimally aligned replicated segments of this and a matching primary is substantially improved as compared to the flight mirrors for Astro-E. This approach using metal mandrels, superpolishing, and replicated ultralightweight foil mirrors, may represent a cost-effective approach to meeting the 15 arcsec half-energy width and weight requirements for the Constellation-X mission. Descriptions of the polishing apparatus, the precision metrology instruments, and the surface data analysis are presented. The general methods describe dare applicable to precision optics for both normal incidence and grazing incidence optics.

Paper Details

Date Published: 29 September 1999
PDF: 12 pages
Proc. SPIE 3766, X-Ray Optics, Instruments, and Missions II, (29 September 1999); doi: 10.1117/12.363647
Show Author Affiliations
David A. Content, NASA Goddard Space Flight Ctr. (United States)
Timo T. Saha, NASA Goddard Space Flight Ctr. (United States)
Robert Petre, NASA Goddard Space Flight Ctr. (United States)
James J. Lyons, NASA Goddard Space Flight Ctr. (United States)
Geraldine A. Wright, NASA Goddard Space Flight Ctr. (United States)
John J. Zaniewski, NASA Goddard Space Flight Ctr. (United States)
Kai-Wing Chan, Universities' Space Research Association and NASA Goddard Space Flight Ctr. (United States)


Published in SPIE Proceedings Vol. 3766:
X-Ray Optics, Instruments, and Missions II
Richard B. Hoover; Arthur B. C. Walker, Editor(s)

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