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Proceedings Paper

X-ray scatter measurements from thermally slumped thin glass substrates for the HEFT hard x-ray telescopes
Author(s): Ahsen M. Hussain; Finn Erland Christensen; Mario A. Jimenez-Garate; William W. Craig; Charles J. Hailey; Todd R. Decker; Marcela Stern; David L. Windt; Peter H. Mao; Fiona A. Harrison; Giovanni Pareschi; Manuel Sanchez del Rio; Alexei Souvorov; Andreas K. Freund; Remi Tucoulou; Anders Madsen; Christian B. Mammen
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Paper Abstract

We have performed x-ray specular reflectivity and scattering measurements of thermally slumped glass substrates on x-ray diffractometers utilizing a rotating anode x-ray source at the Danish Space Research Institute (DSRI) and synchrotron radiation at the European Synchrotron Radiation Facility (ESRF) optics Bending Magnet beamline. In addition, we tested depth graded W/Si multilayer-coated slumped glass using x-ray specular reflectivity measurements at 8.048 keV and 28 keV and energy-dispersive measurements in the 20-50 keV rang at a double-axis diffractometer at the Orsted Laboratory, University of Copenhagen. The thermally slumped glass substrates will be used to fabricate the hard x-ray grazing incidence optics for the High-Energy Focusing Telescope. We compared the measurements to the SODART- mirrors from the SRG telescope mission program. The surface scatter measurement of the thermally slumped glass substrates yields Half Power Diameters (HPD's) of single- bounce mirrors of full-illuminated lengths of approximately 40 arcseconds for typical substrates and as low as approximately 10 arcseconds for the best substrates, whereas the SODART mirrors yields HPD's of approximately 80 arcseconds with very little variation. Both free-standing glass substrates and prototype mounted and multilayer-coated optics were tested. The result demonstrate that the surface scatter contribution, plus any contribution from the mounting procedure, to the Half Power Diameter from a telescope using the slumped glass optics will be in the subarcminute range.In addition we measured low surface microroughness, yielding high reflectivity, from the glass substrates, as well as from the depth graded W/Si multilayer-coated glass.

Paper Details

Date Published: 29 September 1999
PDF: 13 pages
Proc. SPIE 3766, X-Ray Optics, Instruments, and Missions II, (29 September 1999); doi: 10.1117/12.363635
Show Author Affiliations
Ahsen M. Hussain, Danish Space Research Institute (Denmark)
Finn Erland Christensen, Danish Space Research Institute (Denmark)
Mario A. Jimenez-Garate, Columbia Univ. (United States)
William W. Craig, Columbia Univ. (United States)
Charles J. Hailey, Columbia Univ. (United States)
Todd R. Decker, Columbia Univ. (United States)
Marcela Stern, Columbia Univ. (United States)
David L. Windt, Lucent Technologies/Bell Labs. (United States)
Peter H. Mao, California Institute of Technology (United States)
Fiona A. Harrison, California Institute of Technology (United States)
Giovanni Pareschi, Osservatorio Astronomico di Brera (Italy)
Manuel Sanchez del Rio, European Synchrotron Radiation Facility (France)
Alexei Souvorov, European Synchrotron Radiation Facility (Japan)
Andreas K. Freund, European Synchrotron Radiation Facility (France)
Remi Tucoulou, European Synchrotron Radiation Facility (France)
Anders Madsen, Univ. of Copenhagen (Denmark)
Christian B. Mammen, Univ. of Copenhagen (Denmark)

Published in SPIE Proceedings Vol. 3766:
X-Ray Optics, Instruments, and Missions II
Richard B. Hoover; Arthur B. C. Walker, Editor(s)

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