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Proceedings Paper

Modulation transfer function testing of a time-delay-integrate charge-coupled-device imager using a flashlamp light source
Author(s): Brent P. Canova; Robert Joe Day; John J. Lumia
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Paper Abstract

MTF testing of optical systems incorporating high-speed time-delay-integrate device (CCD) arrays has typically been a challenging task, more so than area or linear arrays. TDI imaging depends upon the synchronized motion of an image with the clocking of TDI lines. Simulating this motion often requires complicated and very precise mechanical equipment such as a moving belt or rotating drum. An alternative to this mechanical approach involves the use of a flashlamp to freeze the motion of an object during one of the TDI integration stages. This flashlamp method is straightforward and eliminates MTF errors due to velocity mismatch and scan misalignment. This paper describes the approach used to obtain sine wave and knife-edge images for MTF analysis using the flashlamp method. Test data and results for an instrument with a large aperture that is used in R and D for high-resolution space-based imaging is presented.

Paper Details

Date Published: 24 September 1999
PDF: 8 pages
Proc. SPIE 3750, Earth Observing Systems IV, (24 September 1999); doi: 10.1117/12.363532
Show Author Affiliations
Brent P. Canova, Ball Aerospace & Technologies Corp. (United States)
Robert Joe Day, Ball Aerospace & Technologies Corp. (United States)
John J. Lumia, Ball Aerospace & Technologies Corp. (United States)

Published in SPIE Proceedings Vol. 3750:
Earth Observing Systems IV
William L. Barnes, Editor(s)

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