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Proceedings Paper

Development of a compact optical MEMS scanner with integrated VCSEL light source and diffractive optics
Author(s): Thomas W. Krygowski; David Reyes; M. Steven Rodgers; James H. Smith; Mial E. Warren; William C. Sweatt; Olga Blum-Spahn; Joel R. Wendt; Randolph E. Asbill
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Paper Abstract

In this work the design and initial fabrication results are reported for the components of a compact optical-MEMS laser scanning system. This system integrates a silicon MEMS laser scanner, a Vertical Cavity Surface Emitting Laser (VCSEL) and passive optical components. The MEMS scanner and VCSEL are mounted onto a fused silica substrate which serves as an optical interconnect between the devices. Two Diffractive Optical Elements (DOE's) are etched into the fused silica substrate to focus the VCSEL beam and increase the scan range. The silicon MEMS scanner consists of an actuator that continuously scans the position of a large polysilicon gold- coated shuttle containing a third DOE. Interferometric measurements show that the residual stress in the 50 micrometer X 1000 micrometer shuttle is extremely low, with a maximum deflection of only 0.18 micrometer over an 800 micrometer span for an unmetallized case and a deflection of 0.56 micrometer for the metallized case. A conservative estimate for the scan range is approximately plus or minus 4 degrees, with a spot size of about 0.5 mm, producing 50 resolvable spots. The basic system architecture, optical and MEMS design is reported in this paper, with an emphasis on the design and fabrication of the silicon MEMS scanner portion of the system.

Paper Details

Date Published: 2 September 1999
PDF: 9 pages
Proc. SPIE 3878, Miniaturized Systems with Micro-Optics and MEMS, (2 September 1999); doi: 10.1117/12.361250
Show Author Affiliations
Thomas W. Krygowski, Sandia National Labs. (United States)
David Reyes, Sandia National Labs. (United States)
M. Steven Rodgers, Sandia National Labs. (United States)
James H. Smith, Sandia National Labs. (United States)
Mial E. Warren, Sandia National Labs. (United States)
William C. Sweatt, Sandia National Labs. (United States)
Olga Blum-Spahn, Sandia National Labs. (United States)
Joel R. Wendt, Sandia National Labs. (United States)
Randolph E. Asbill, Sandia National Labs. (United States)


Published in SPIE Proceedings Vol. 3878:
Miniaturized Systems with Micro-Optics and MEMS
M. Edward Motamedi; Rolf Goering, Editor(s)

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