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Proceedings Paper

In-plane aligned YBCO tape on textured YSZ buffer layer deposited on NiCr alloy substrate by laser ablation with only O+ ion beam assistance
Author(s): Xintang Huang; You-qing Wang; Qiulang Wang; Qingming Chen; Qiyang Xu; Zhongke Wang
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Paper Abstract

High critical current density and in-plane aligned YBa2Cu3O7-x (YBCO) films on textured yttria- stabilized zirconia (YSZ) buffer layers deposited on NiCr alloy (Hastelloy c-275) substrates by laser ablation with only O+ ion beam assistance were fabricated. The X- ray Phi-scan full width at half-maximums for YSZ (202) and YBCO (103) were 18 degree(s) and 11 degree(s) respectively. A critical current density of 7.9 X 105 A/cm2 of YBCO films was obtained at liquid nitrogen temperature and zero field. The critical temperature of the YBCO tape was 90 K.

Paper Details

Date Published: 8 September 1999
PDF: 4 pages
Proc. SPIE 3862, 1999 International Conference on Industrial Lasers, (8 September 1999); doi: 10.1117/12.361114
Show Author Affiliations
Xintang Huang, Huazhong Univ. of Science and Technology and Central China Normal Univ. (China)
You-qing Wang, Huazhong Univ. of Science and Technology (China)
Qiulang Wang, Huazhong Univ. of Science and Technology (China)
Qingming Chen, Huazhong Univ. of Science and Technology (China)
Qiyang Xu, Huazhong Univ. of Science and Technology (China)
Zhongke Wang, Huazhong Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 3862:
1999 International Conference on Industrial Lasers
Fuxi Gan; Horst Weber; Zaiguang Li; Qingming Chen, Editor(s)

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