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Proceedings Paper

Critical factors in the laser beam characterization measurement algorithm
Author(s): Wei Sun; Guang Hui Wei
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Paper Abstract

Laser beam characterization is very important in some applications of industrial lasers. Besides many factors of the CCD measurement system and the properties of the beam power density distributions to be measured, the obtained accuracy of laser beam characterization also depends strongly on the beam parameters' calculation algorithm. In this paper a simulated beam width calculation was performed in order to determine the influence on the accuracy of laser beam width measurement of some factors of beam measurement algorithm. A mathematically simulated Gaussian and Super Gaussian beam was computer generated. Background and random noise with a Gaussian distribution were added to the mathematically generated beam. Measurements were then made based on second moment method which is a ISO definition. We change the background, noise level and the size of integration area during the simulated calculation so as to determine the influence on the accuracy of beam width measurement of these different factors. Based on the result of investigation, the critical factors and their solutions in the laser beam characterization algorithm are discussed, it is concluded that a calculation algorithm which can control the baseline drift and random noise effectively is essential to get high beam measurement accuracy.

Paper Details

Date Published: 8 September 1999
PDF: 6 pages
Proc. SPIE 3862, 1999 International Conference on Industrial Lasers, (8 September 1999); doi: 10.1117/12.361085
Show Author Affiliations
Wei Sun, Beijing Institute of Technology (China)
Guang Hui Wei, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 3862:
1999 International Conference on Industrial Lasers
Fuxi Gan; Horst Weber; Zaiguang Li; Qingming Chen, Editor(s)

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