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Proceedings Paper

Quasi-optical characterization of waveguides at frequencies above 100 GHz
Author(s): Silas Hadjiloucas; John W. Bowen; John W. Digby; J. Martyn Chamberlain; David Paul Steenson
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Paper Abstract

We analyze the precision of a quasi-optical null-balance bridge reflectometer in measuring waveguide characteristic impedance and attenuation using a one-port de-embedding after taking into account errors due to imperfect coupling of two fundamental Gaussian beam. In order to determine the desired precision, we present in-waveguide measurements of characteristic impedance and attenuation for a WR-8 adjustable precision short in the 75-110 GHz frequency range using a Hewlett-Packard HP 8510 vector network analyzer.

Paper Details

Date Published: 9 September 1999
PDF: 9 pages
Proc. SPIE 3828, Terahertz Spectroscopy and Applications II, (9 September 1999); doi: 10.1117/12.361058
Show Author Affiliations
Silas Hadjiloucas, Univ. of Reading (United Kingdom)
John W. Bowen, Univ. of Reading (United Kingdom)
John W. Digby, Univ. of Nottingham (United Kingdom)
J. Martyn Chamberlain, Univ. of Nottingham (United Kingdom)
David Paul Steenson, Univ. of Leeds (United Kingdom)


Published in SPIE Proceedings Vol. 3828:
Terahertz Spectroscopy and Applications II
J. Martyn Chamberlain, Editor(s)

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