Share Email Print
cover

Proceedings Paper

Parallel-plate electrostatic dual-mass resonator
Author(s): Christopher W. Dyck; James J. Allen; Robert J. Huber
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A surface-micromachined two-degree-of-freedom system that was driven by parallel-plate actuation at antiresonance was demonstrated. The system consisted of an absorbing mass connected by folded springs to a drive mass. The system demonstrated substantial motion amplification at antiresonance. The absorber mass amplitudes were 0.8 - 0.85 micrometer at atmospheric pressure while the drive mass amplitudes were below 0.1 micrometer. Larger absorber mass amplitudes were not possible because of spring softening in the drive mass springs. Simple theory of the dual-mass oscillator has indicated that the absorber mass may be insensitive to limited variations in strain and damping. This needs experimental verification. Resonant and antiresonant frequencies were measured and compared to the designed values. Resonant frequency measurements were difficult to compare to the design calculations because of time-varying spring softening terms that were caused by the drive configuration. Antiresonant frequency measurements were close to the design value of 5.1 kHz. The antiresonant frequency was not dependent on spring softening. The measured absorber mass displacement at antiresonance was compared to computer simulated results. The measured value was significantly greater, possibly due to neglecting fringe fields in the force expression used in the simulation.

Paper Details

Date Published: 31 August 1999
PDF: 12 pages
Proc. SPIE 3876, Micromachined Devices and Components V, (31 August 1999); doi: 10.1117/12.360495
Show Author Affiliations
Christopher W. Dyck, Sandia National Labs. (United States)
James J. Allen, Sandia National Labs. (United States)
Robert J. Huber, Sandia National Labs. (United States)


Published in SPIE Proceedings Vol. 3876:
Micromachined Devices and Components V
Patrick J. French; Eric Peeters, Editor(s)

© SPIE. Terms of Use
Back to Top