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Proceedings Paper

Analysis of noise and fluctuations in micromachined devices
Author(s): Andreas Greiner; Jan G. Korvink
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Paper Abstract

We investigate noise and fluctuations in Micro-Electro- Mechanical-Systems (MEMS). MEMS operate on many different subsystem levels and in different energy domains. In the following we analyze two subsystems in more detail: (1) the electronic subsystem represented by the circuitry part of the device, (2) the mechanical subsystem consisting of fragile vibrating mechanical structures. Mode amplitudes of vibrating structures are subject to interaction with their environment, i.e. gaseous, liquid, and electronic systems, each of which shows fluctuations and noisy behavior by itself. Our approach focuses on finding the time-scales and the dominant process in order to determine the noise behavior. By applying the fluctuation-dissipation theorem we are able to extract various response coefficients, such as e.g. the carrier electric and thermal conductivity and the quality factors of the vibrational modes. The impact of response coefficients due to the cross correlations of subsystems may be analyzed. The analysis is performed by numerical simulations of an appropriate model for the different sub-systems in terms of stochastic differential equations of motion for the respective observable quantities. These are the vibrational amplitudes, the electronic densities and the currents. The resulting correlation functions are analyzed.

Paper Details

Date Published: 31 August 1999
PDF: 9 pages
Proc. SPIE 3876, Micromachined Devices and Components V, (31 August 1999); doi: 10.1117/12.360485
Show Author Affiliations
Andreas Greiner, Albert-Ludwig-Univ. Freiburg (Germany)
Jan G. Korvink, Albert-Ludwig-Univ. Freiburg (Germany)


Published in SPIE Proceedings Vol. 3876:
Micromachined Devices and Components V
Patrick J. French; Eric Peeters, Editor(s)

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