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Proceedings Paper

Some aspects on the mechanical analysis of microshutters
Author(s): Rainer K. Fettig; Jonathan L. Kuhn; Samuel Harvey Moseley Jr.; Alexander S. Kutyrev; Jon Orloff; Shude D. Lu
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Paper Abstract

An array of individually addressable micro-shutters is being designed for spectroscopic applications. Details of the design are presented in a companion paper. The mechanical design of a single shutter element has been completed. This design consists of a shutter blade suspended on a torsion beam manufactured out of single crystal silicon membranes. During operation the shutter blade will be rotated by 90 degrees out of the array plane. Thus, the stability and durability of the beams are crucial for the reliability of the devices. Structures were fabricated using focused ion beam milling in a FEI 620 dual beam machine, and subsequent testing was completed using the same platform. This allowed for short turn around times. We performed torsion and bending experiments to determine key characteristics of the membrane material. Results of measurements on prototype shutters were compared with the predictions of the numerical models. The data from these focused studies were used in conjunction with experiments and numerical models of shutter prototypes to optimize the design. In this work, we present the results of the material studies, and assess the mechanical performance of the resulting design.

Paper Details

Date Published: 3 September 1999
PDF: 11 pages
Proc. SPIE 3875, Materials and Device Characterization in Micromachining II, (3 September 1999); doi: 10.1117/12.360473
Show Author Affiliations
Rainer K. Fettig, Raytheon ITSS (United States)
Jonathan L. Kuhn, NASA Goddard Space Flight Ctr. (United States)
Samuel Harvey Moseley Jr., NASA Goddard Space Flight Ctr. (United States)
Alexander S. Kutyrev, Raytheon ITSS (United States)
Jon Orloff, Univ. of Maryland/College Park (United States)
Shude D. Lu, Univ. of Maryland/College Park (United States)

Published in SPIE Proceedings Vol. 3875:
Materials and Device Characterization in Micromachining II
Yuli Vladimirsky; Craig R. Friedrich, Editor(s)

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