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Proceedings Paper

Stemware inspection system
Author(s): Jaroslaw P. Sacha; Spencer D. Luster; Behrouz N. Shabestari; John W. V. Miller; Murat Sena
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Paper Abstract

The objective of the system is inspection of individual pieces of stemware for geometry defects and glass imperfections. Cameras view stemware from multiple angles to increase surface coverage. The inspection images are acquired at three stations. The first inspects internal glass quality, detecting defects such as chemical residue and waviness. The second inspects the rim, geometry of the stemware body and stem, and internal defects such as cracks. The third station inspects the stemware base for geometrical and internal defects. Glass defects are optically enhanced through the use of striped pattern back lighting combined with morphological processing. Geometry inspection is enhanced through the use of converging illumination at the second station, while the third station utilizes large field true telecentric imaging. Progressive scan cameras and frame grabbers capable of simultaneous image capture are used at each station. The system software comprises six modules: system manager, I/O manager, inspection module for each station, and stemware sorting and logging module. Each module is run as a separate application. Applications communicate with each other through TCP/IP sockets, and can be run in a multi-computer or single-computer setup. Currently two Windows NT workstations are used to host the system.

Paper Details

Date Published: 27 August 1999
PDF: 7 pages
Proc. SPIE 3836, Machine Vision Systems for Inspection and Metrology VIII, (27 August 1999); doi: 10.1117/12.360274
Show Author Affiliations
Jaroslaw P. Sacha, Edison Industrial Systems Ctr. (United States)
Spencer D. Luster, Light Works (United States)
Behrouz N. Shabestari, Edison Industrial Systems Ctr. (United States)
John W. V. Miller, Univ. of Michigan/Dearborn (United States)
Murat Sena, Visionex, Inc. (United States)

Published in SPIE Proceedings Vol. 3836:
Machine Vision Systems for Inspection and Metrology VIII
John W. V. Miller; Susan Snell Solomon; Bruce G. Batchelor, Editor(s)

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