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Proceedings Paper

Comparison of connected-component algorithms
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Paper Abstract

The SKIPSM paradigm offers fast execution of a very wide range of binary, grey-scale, 3D, and color image-processing applications. In this paper the finite-state-machine approach is applied to one of the 'classical' problems of binary image processing: connected-component analysis. Execution-time results are presented, and compared for several examples to execution times for the very-efficient conventional method based on analysis of run-length-encoded data.

Paper Details

Date Published: 27 August 1999
PDF: 8 pages
Proc. SPIE 3836, Machine Vision Systems for Inspection and Metrology VIII, (27 August 1999); doi: 10.1117/12.360267
Show Author Affiliations
Frederick M. Waltz, Consultant (United States)
John W. V. Miller, Univ. of Michigan/Dearborn (United States)

Published in SPIE Proceedings Vol. 3836:
Machine Vision Systems for Inspection and Metrology VIII
John W. V. Miller; Susan Snell Solomon; Bruce G. Batchelor, Editor(s)

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