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Proceedings Paper

Wide-scale surface characterization by combination of scanning force microscopy, white light interferometry, and light scattering
Author(s): Stefan Gliech; Angela Duparre; Rolf-Juergen Recknagel; Gunther Notni
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Paper Abstract

A variety of technical applications require surface roughnesses to be measured and characterized over a wide range of scale. Therefore, it is inevitable to combine different measurements methods, both optical and nonoptical. In this paper, we present results of white light interferometry, atomic force microscopy, and angle resolved scattering. In addition we use total scattering to control the surface roughness and its inhomogeneities over large sample areas. Power spectral density functions are used to combine the roughness data obtained from the measurements over difference scales and to characterize the surface by means of model PSDs. We present results from different statistically rough surfaces, such as quartz and black glass, Si-wafers, and polished brass surfaces.

Paper Details

Date Published: 6 September 1999
PDF: 8 pages
Proc. SPIE 3739, Optical Fabrication and Testing, (6 September 1999); doi: 10.1117/12.360166
Show Author Affiliations
Stefan Gliech, Fraunhofer-Institut fuer Angewandte Optik und Feinmechanik (Germany)
Angela Duparre, Fraunhofer-Institut fuer Angewandte Optik und Feinmechanik (Germany)
Rolf-Juergen Recknagel, Fraunhofer-Institut fuer Angewandte Optik und Feinmechanik (Germany)
Gunther Notni, Fraunhofer-Institut fuer Angewandte Optik und Feinmechanik (Germany)


Published in SPIE Proceedings Vol. 3739:
Optical Fabrication and Testing
Roland Geyl; Jonathan Maxwell, Editor(s)

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