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Proceedings Paper

Light scattering from WDM filters
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Paper Abstract

Light scattering is well known to be a key limitation of the ultimate performances of filters. Whatever the values of surface roughness and bulk heterogeneity within the multilayer, the optical losses depend on the stack design and on the correlation factors between defects. Such situation is largely enhanced in the case of WDM filters, due to the high over-intensity of the electric field within the stack, as a consequence of the narrow pass-band. In this paper, we present some experimental scattering result recorded with a high angular and spectral resolution on prototype WDM filters and which illustrate the enhancement of scattering near the design wavelength of the filter.

Paper Details

Date Published: 7 September 1999
PDF: 10 pages
Proc. SPIE 3738, Advances in Optical Interference Coatings, (7 September 1999); doi: 10.1117/12.360090
Show Author Affiliations
Michel Lequime, Ecole Nationale Superieure de Physique de Marseille (France)
Carole Deumie, Ecole Nationale Superieure de Physique de Marseille (France)
Claude Amra, Ecole Nationale Superieure de Physique de Marseille (France)

Published in SPIE Proceedings Vol. 3738:
Advances in Optical Interference Coatings
Claude Amra; H. Angus Macleod, Editor(s)

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