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Proceedings Paper

Optical characterization of cerium-vanadium mixed oxide films for electrochromic devices
Author(s): Francesca Varsano; A. V. Krasilnikova; Franco Decker; Enrico Masetti
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Paper Abstract

Films of Ce-V mixed oxide were deposited by reactive r.f. sputtering from a target of cold pressed CeO2 and V2O5 mixed powders. Optical and ion storage properties of the films have been studied in function of the oxygen partial pressure inside the sputtering chamber during the deposition process. Li intercalation was accomplished electrochemically. Optical constants have been determined for as-deposited and intercalated films.

Paper Details

Date Published: 7 September 1999
PDF: 5 pages
Proc. SPIE 3738, Advances in Optical Interference Coatings, (7 September 1999); doi: 10.1117/12.360069
Show Author Affiliations
Francesca Varsano, Univ. of Rome La Sapienza (Italy)
A. V. Krasilnikova, Moscow State Univ. (Russia)
Franco Decker, Univ. of Rome La Sapienza (Italy)
Enrico Masetti, ENEA (Italy)


Published in SPIE Proceedings Vol. 3738:
Advances in Optical Interference Coatings
Claude Amra; H. Angus Macleod, Editor(s)

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