Share Email Print

Proceedings Paper

Aberration theory and a design method of double-element optical systems
Author(s): Shin Masui; Takeshi Namioka
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

To establish the theoretical basis for providing a better design method of synchrotron radiation beamline optics, we have developed a third-order aberration theory of a double- grating system and derived analytic formulas for spot diagrams and aberration curves. We describe an analytic merit function and a new definition of the resolving power. The former closely represents the variance of a very large number of ray-traced spots in the image plane and takes into account the dimensions of a source and optical elements. The latter takes into account the effects of an asymmetric line profile and a finite exit-slit width. The equations of aberration curves, merit function, and the definition of the resolving power are evaluated by taking three designs of a Monk-Gillieson varied-spacing plane grating monochromator as testing optics. The analytic merit function is used for these designs. The result show that the features of ray- traced spot diagrams can be analyzed by means of aberration curves and that realistic resolving power can be predicted by the new definition. The results also show the relation between the formation of coma-free images and the choice of design wavelengths. All these findings support the effectiveness of the analytic merit function in the design work.

Paper Details

Date Published: 27 August 1999
PDF: 11 pages
Proc. SPIE 3737, Design and Engineering of Optical Systems II, (27 August 1999); doi: 10.1117/12.360045
Show Author Affiliations
Shin Masui, Sumitomo Heavy Industries, Ltd. (Japan)
Takeshi Namioka, Tohoku Univ. (Japan)

Published in SPIE Proceedings Vol. 3737:
Design and Engineering of Optical Systems II
Fritz Merkle, Editor(s)

© SPIE. Terms of Use
Back to Top