Share Email Print

Proceedings Paper

Design of a compact 3D laser scanner
Author(s): Mark Geusen; Willem D. van Amstel; Stefan M. B. Baumer; Jef L. Horijon
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A design study for a compact 3D scanner, called Coplan, is presented. The Coplan is intended to be used for high speed, in-line coplanarity and shape measurement of electronic components, like Ball Grid Arrays and Surface Mount Devices. The scanner should have a scan length of at least 2 inches and a resolution of 5 micrometers in all 3 dimensions. First an analysis of two different scan schemes is made: a so-called pre-objective scheme using an F-(theta) scan lens and a post- objective scheme using a so-called banana field flattener, consisting of a convex, cylindrical hyperbolic mirror and a concave, cylindrical parabolic mirror. Secondly, an analysis of height resolution requirements for triangulation and confocal depth sensing has been made. It is concluded that for both methods of depth sensing a synchronous scheme with a 50-60 degrees detection angle in cross scan direction is required. It is shown that a post-objective scheme consisting of a banana mirror system combined with triangulation height detection offers the best solution for the optical requirements.

Paper Details

Date Published: 27 August 1999
PDF: 9 pages
Proc. SPIE 3737, Design and Engineering of Optical Systems II, (27 August 1999); doi: 10.1117/12.360015
Show Author Affiliations
Mark Geusen, Stan Ackermans Institute and Philips Ctr. for Manufacturing Technology (Netherlands)
Willem D. van Amstel, Philips Ctr. for Manufacturing Technology (Netherlands)
Stefan M. B. Baumer, Philips Ctr. for Manufacturing Technology (Netherlands)
Jef L. Horijon, Philips Ctr. for Manufacturing Technology (Netherlands)

Published in SPIE Proceedings Vol. 3737:
Design and Engineering of Optical Systems II
Fritz Merkle, Editor(s)

© SPIE. Terms of Use
Back to Top