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Proceedings Paper

Total profile distortion Z-scan
Author(s): Aristides Alfredo Marcano O.; A. Solis; E. Hernandez; Herve Maillotte
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Paper Abstract

We propose a new method for the measurement of nonlinear susceptibility of an optical material based on the recording of the total distortions of the wave-front of a light wave propagating through the medium. We compare the method with the usual Z-scan and EZ-scan techniques and demonstrate theoretically and experimentally the better sensitivity of the new method.

Paper Details

Date Published: 6 July 1999
PDF: 10 pages
Proc. SPIE 3572, 3rd Iberoamerican Optics Meeting and 6th Latin American Meeting on Optics, Lasers, and Their Applications, (6 July 1999); doi: 10.1117/12.358370
Show Author Affiliations
Aristides Alfredo Marcano O., Instituto Venezolano de Investigaciones Cientificas (Venezuela)
A. Solis, Instituto Venezolano de Investigaciones Cientificas (Venezuela)
E. Hernandez, Instituto Venezolano de Investigaciones Cientificas (Venezuela)
Herve Maillotte, Univ. de Franche-Comte (France)


Published in SPIE Proceedings Vol. 3572:
3rd Iberoamerican Optics Meeting and 6th Latin American Meeting on Optics, Lasers, and Their Applications
Angela Maria Guzman, Editor(s)

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