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Proceedings Paper

Method for determining threshold power of amplification in erbium-doped fiber by means of measurements of ASE on both directions on the fiber
Author(s): R. J. Selvas Aguilar; Evgueni Anatolevich Kuzin; Jose Javier Sanchez-Mondragon; M. A. Basurto Pensado; L. C. Archundia Berra
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Paper Abstract

Recent developments in the construction of Erbium-doped fibers have seen parallel progress in the measurement techniques to characterize these fibers. In this paper, we discuss a simple method of obtaining threshold power amplification of Erbium-doped fibers. The method can be used to measure the threshold power of this particular fiber. As a result, the predicted threshold power value is in very good agreement with the experimental results obtained. We have based our measurements of the amplified spontaneous emission on both the forward and the backward directions of the fiber axis. We also report on other parameters such as Erbium doping concentration, the spectrum of absorption, and cross sections, with the objective of obtaining data for comparison of predicted threshold amplification with actual threshold amplification, when the Erbium-doped fibers are used in laser systems.

Paper Details

Date Published: 6 July 1999
PDF: 6 pages
Proc. SPIE 3572, 3rd Iberoamerican Optics Meeting and 6th Latin American Meeting on Optics, Lasers, and Their Applications, (6 July 1999); doi: 10.1117/12.358360
Show Author Affiliations
R. J. Selvas Aguilar, Univ. Autonoma del Estado de Morelos (Mexico)
Evgueni Anatolevich Kuzin, Instituto Nacional de Astrofisica, Optica y Electronica (Mexico)
Jose Javier Sanchez-Mondragon, Instituto Nacional de Astrofisica, Optica y Electronica and Univ. Autonoma del Estado de M (Mexico)
M. A. Basurto Pensado, Instituto Nacional de Astrofisica, Optica y Electronica and Univ. Autonoma del Estado de M (Mexico)
L. C. Archundia Berra, Univ. Autonoma del Estado de Morelos (Mexico)


Published in SPIE Proceedings Vol. 3572:
3rd Iberoamerican Optics Meeting and 6th Latin American Meeting on Optics, Lasers, and Their Applications
Angela Maria Guzman, Editor(s)

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