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Proceedings Paper

PZT thin films grown by laser ablation
Author(s): Tupac Garcia; E. de Posada; Ernesto Jimenez; F. Calderon; Pascual Bartolo-Perez; J. L. Pena
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Paper Abstract

PZT thin films were deposited by laser ablation at high vacuum and at room temperature. After that, some of the samples were annealed at air in the temperature range 450 degree(s)C - 550 degree(s)C. The samples were characterized by XPS and X-ray diffraction. A decrease in the oxygen composition of the as-deposited sample was observed. In the as-deposited film metallic lead (Pb) appeared. The as-deposited analyzed film showed a weak crystallization. A posterior annealing of the as-grown films improved their crystalline structure. This annealing treatment provoked the disappearance of the metallic Pb bonds in the films.

Paper Details

Date Published: 6 July 1999
PDF: 4 pages
Proc. SPIE 3572, 3rd Iberoamerican Optics Meeting and 6th Latin American Meeting on Optics, Lasers, and Their Applications, (6 July 1999); doi: 10.1117/12.358344
Show Author Affiliations
Tupac Garcia, Univ. de La Habana (Cuba)
E. de Posada, Univ. de La Habana (Cuba)
Ernesto Jimenez, Univ. de La Habana (Cuba)
F. Calderon, Univ. de La Habana (Cuba)
Pascual Bartolo-Perez, Ctr. de Investigacion y de Estudios Avanzados del IPN (Mexico)
J. L. Pena, Ctr. de Investigacion y de Estudios Avanzados del IPN (Mexico)


Published in SPIE Proceedings Vol. 3572:
3rd Iberoamerican Optics Meeting and 6th Latin American Meeting on Optics, Lasers, and Their Applications

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