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Proceedings Paper

Compact shearography system for the measurement of 3D deformation
Author(s): Stephan Waldner; Stefan Brem
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Paper Abstract

In this manuscript we present the development of an integrated shearography system that is able to measure the 3D deformation of an object surface. In order to determine all six displacement derivatives that may contribute to shearography results, six measurements with three different sensitivity directions and two shear directions have to be performed. The realized system is able to perform this measurement sequence in an automated way.

Paper Details

Date Published: 17 August 1999
PDF: 8 pages
Proc. SPIE 3745, Interferometry '99: Applications, (17 August 1999); doi: 10.1117/12.357771
Show Author Affiliations
Stephan Waldner, Swiss Federal Institute of Technology Zurich (Switzerland)
Stefan Brem, Swiss Federal Institute of Technology Zurich (Switzerland)


Published in SPIE Proceedings Vol. 3745:
Interferometry '99: Applications
Werner P. O. Jueptner; Krzysztof Patorski, Editor(s)

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