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Proceedings Paper

Speckle interferometry: optoelectronic developments and applications
Author(s): Ralph P. Tatam
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Paper Abstract

Since the initial concept of speckle interferometry was published more than 30 years ago the subject has matured to the point where it is now an engineering tool used in a wide range of applications with instrumentation available from a number of companies. The development of the technique to this level has been accomplished by making use of parallel developments in a range of technological areas. These are the laser, the PC, and the CCD camera. More recently the incorporation of optical fiber technology has also had a major impact. This paper reviews recent developments in the optoelectronic technology used in speckle interferometry instrumentation and the use made of it in a range of application areas.

Paper Details

Date Published: 17 August 1999
PDF: 20 pages
Proc. SPIE 3745, Interferometry '99: Applications, (17 August 1999); doi: 10.1117/12.357769
Show Author Affiliations
Ralph P. Tatam, Cranfield Univ. (United Kingdom)


Published in SPIE Proceedings Vol. 3745:
Interferometry '99: Applications
Werner P. O. Jueptner; Krzysztof Patorski, Editor(s)

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