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Proceedings Paper

Direct measurement of refractive index profile in liquid crystal planar waveguides
Author(s): Aleksander Kiezun; Leszek R. Jaroszewicz; Andrzej Walczak; Edward Nowinowski-Kruszelnicki
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Paper Abstract

The collected results of the refraction index profile measurement in highly anisotropic, tunable liquid crystalline waveguides are presented. The three different liquid crystal substances have been examined. Initial orientation of the liquid crystal layer is deformed by an external electric field. The initial orientations have been prepared as twisted and planar for liquid crystal material with positive dielectric anisotropy. In the liquid crystal material with negative dielectric anisotropy as initial has been examined hybrid orientation.

Paper Details

Date Published: 17 August 1999
PDF: 7 pages
Proc. SPIE 3745, Interferometry '99: Applications, (17 August 1999); doi: 10.1117/12.357766
Show Author Affiliations
Aleksander Kiezun, Military Univ. of Technology (Poland)
Leszek R. Jaroszewicz, Military Univ. of Technology (Poland)
Andrzej Walczak, Military Univ. of Technology (Poland)
Edward Nowinowski-Kruszelnicki, Military Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 3745:
Interferometry '99: Applications

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