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Proceedings Paper

Application of wavelet filters for feature extraction in interferometric fringe patterns
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Paper Abstract

The fast and reliable localization and classification of fault indicating fringe patterns in interferometric images is a major task in holographic non-destructive testing. For the purpose of feature extraction from gray value images, wavelet transformation has proved to be a suitable tool. In contrast to the Fourier transformation the local feature information will be preserved and furthermore the applied transforming wavelet can be adapted--under certain constraints--to the given problem.

Paper Details

Date Published: 13 August 1999
PDF: 9 pages
Proc. SPIE 3744, Interferometry '99: Techniques and Technologies, (13 August 1999); doi: 10.1117/12.357722
Show Author Affiliations
Daniel Kayser, Bremer Institut fuer Angewandte Strahltechnik (Germany)
Wolfgang Osten, Bremer Institut fuer Angewandte Strahltechnik (Germany)
Sven Krueger, Humboldt Univ. zu Berlin (Germany)
Guenther K.G. Wernicke, Humboldt Univ. zu Berlin (Germany)


Published in SPIE Proceedings Vol. 3744:
Interferometry '99: Techniques and Technologies
Malgorzata Kujawinska; Mitsuo Takeda, Editor(s)

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