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Proceedings Paper

Influence of phase singularities on the interferometric measurement of out-of-plane displacements
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Paper Abstract

Singularities in speckle fields are single points where the phase value is not defined. Consequently phase singularities decrease the resolution of interferometric measurement methods such as ESPI or HI. In this paper the behavior of phase singularities in the image plane is investigated for the case that the illuminated object is displaced along the optical axis. The investigations have been performed by means of simulations and measurements. Both, the model used to simulate subjective speckle fields and the experimental setup to measure the phase changes in the image plane are described. To observe the appearance and the disappearance of singularities, the object displacement was divided into a series of smaller displacement steps. The lateral speckle phase in the image plane was generated numerically for each displacement step. This way the transformation of the whole phase field could be visualized and the path of the singularities could be traced. The results obtained from these simulations are verified experimentally: For each displacement step the speckle phase was measured interferometrically along a column of a CCD-sensor. The behavior of the measured speckle phase is compared to the numerical results. Based on these results the consequences for interferometric out-of-plane displacement measurements are discussed.

Paper Details

Date Published: 13 August 1999
PDF: 9 pages
Proc. SPIE 3744, Interferometry '99: Techniques and Technologies, (13 August 1999); doi: 10.1117/12.357710
Show Author Affiliations
Ervin Kolenovic, Bremer Institut fuer Angewandte Strahltechnik (Germany)
Wolfgang Osten, Bremer Institut fuer Angewandte Strahltechnik (Germany)
Werner P. O. Jueptner, Bremer Institut fuer Angewandte Strahltechnik (Germany)


Published in SPIE Proceedings Vol. 3744:
Interferometry '99: Techniques and Technologies

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