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Proceedings Paper

Optical characterization of multilayer systems with randomly rough boundaries
Author(s): Ivan Ohlidal; Frantisek Vizd'a; Miloslav Ohlidal
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Paper Abstract

In this contribution examples of the optical characterization of multilayer systems with randomly rough boundaries are presented. The method based on measuring and interpreting the spectral dependences of the coherent reflectance is used to determine the values of the optical and statistical parameters of samples of three-layer and thirteen-layer systems exhibiting the rough boundaries. The systems mentioned are formed by thin films of SiO2 and TiO2.

Paper Details

Date Published: 19 July 1999
PDF: 2 pages
Proc. SPIE 3749, 18th Congress of the International Commission for Optics, (19 July 1999); doi: 10.1117/12.355053
Show Author Affiliations
Ivan Ohlidal, Masaryk Univ. (Czech Republic)
Frantisek Vizd'a, Military Academy (Czech Republic)
Miloslav Ohlidal, Technical Univ. of Brno (Czech Republic)


Published in SPIE Proceedings Vol. 3749:
18th Congress of the International Commission for Optics
Alexander J. Glass; Joseph W. Goodman; Milton Chang; Arthur H. Guenther; Toshimitsu Asakura, Editor(s)

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