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Proceedings Paper

Raman study of deformation of polyethylene
Author(s): Kirill A. Prokhorov; G. Yu Nikolaeva; Pavel P. Pashinin; Sergey A. Gordeyev; Ludmila E. Semenova
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Paper Abstract

Oriented polycrystalline polymers with high mechanical properties are very important for many practical applications. Such materials can be produced by drawing at temperatures near to their melting point. During the drawing process, macromolecules are aligned along the drawing direction, which leads to a considerable increase in the Young's modulus, strength and stiffness of polymer. The orientation distribution function of macromolecules is one of the most significant characteristics of the structure of oriented polycrystalline polymers. The coefficients of the distribution function expansion in a series of generalised spherical harmonics can be determined by several techniques, such as X-ray analysis, IR-spectroscopy, and birefringence measurements. Raman spectroscopy is one of the most convenient and informative tools for studying the orientation of macromolecules. It has been shown that Raman spectroscopy is capable of determining the expansion coefficients up to the fourth order for both crystalline and amorphous phases [1,2]. At present, Raman spectroscopy is often used to study the orientational order in a various polycrystalline polymers (see references from [3]). Here we present the investigation of mechanism of uniaxial deformation of polyethylene from the isotropic state to the extremely drawn state (when increasing the draw ratio causes the sample to break apart).

Paper Details

Date Published: 19 July 1999
PDF: 2 pages
Proc. SPIE 3749, 18th Congress of the International Commission for Optics, (19 July 1999); doi: 10.1117/12.355050
Show Author Affiliations
Kirill A. Prokhorov, General Physics Institute (Russia)
G. Yu Nikolaeva, General Physics Institute (Russia)
Pavel P. Pashinin, General Physics Institute (Russia)
Sergey A. Gordeyev, Univ. of Minho (Portugal)
Ludmila E. Semenova, General Physics Institute (Russia)

Published in SPIE Proceedings Vol. 3749:
18th Congress of the International Commission for Optics
Alexander J. Glass; Joseph W. Goodman; Milton Chang; Arthur H. Guenther; Toshimitsu Asakura, Editor(s)

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