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Proceedings Paper

Multibeam Fizeau interferometer image plane
Author(s): Yuri N. Zakharov
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Paper Abstract

Fizeau interferometer pattern analysis have carried out in the case of arbitrary slope beam illumination. Analysis get localization plane location (that is in coincidence with image plane) and its dependence on wedge relative index of refraction and on the interferometer entrance mirror slope angle to the incidence wave. The analyses fits experiment.

Paper Details

Date Published: 19 July 1999
PDF: 2 pages
Proc. SPIE 3749, 18th Congress of the International Commission for Optics, (19 July 1999); doi: 10.1117/12.355010
Show Author Affiliations
Yuri N. Zakharov, Univ. Nizhni Novgorod (Russia)


Published in SPIE Proceedings Vol. 3749:
18th Congress of the International Commission for Optics
Alexander J. Glass; Joseph W. Goodman; Milton Chang; Arthur H. Guenther; Toshimitsu Asakura, Editor(s)

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