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Proceedings Paper

High-reliability GaAs image intensifier with unfilmed microchannel plate
Author(s): Edward J. Bender; Joseph P. Estrera; C. E. Ford; A. Giordana; John W. Glesener; P. P. Lin; A. J. Nico; Timothy W. Sinor; R. H. Smithson
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Paper Abstract

Current GaAs image intensifier technology requires that the microchannel plate (MCP) have a thin dielectric film on the side facing the photocathode. This protective coating substantially reduces the amount of outgassing of ions and neutral species from the microchannels. The prevention of MCP outgassing is necessary in order to prevent the `poisoning' of the Cs:O surface on the GaAs photocathode. Many authors have experimented with omitting the MCP coating. The results of such experiments invariably lead to an intensifier with a reported useful life of less than 100 hours, due to contamination of the Cs:O layer on the photocathode. Unfortunately, the MCP film is also a barrier to electron transport within the intensifier. Substantial enhancement of the image intensifier operating parameters is the motivation for the removal of the MCP film. This paper presents results showing for the first time that it is possible to fabricate a long lifetime image intensifier with a single uncoated MCP.

Paper Details

Date Published: 19 July 1999
PDF: 2 pages
Proc. SPIE 3749, 18th Congress of the International Commission for Optics, (19 July 1999); doi: 10.1117/12.354970
Show Author Affiliations
Edward J. Bender, U.S. Army Night Vision & Electronic Sensors Directorate (United States)
Joseph P. Estrera, Litton Electro-Optical Systems (United States)
C. E. Ford, Litton Electro-Optical Systems (United States)
A. Giordana, Litton Electro-Optical Systems (United States)
John W. Glesener, Litton Electro-Optical Systems (United States)
P. P. Lin, Litton Electro-Optical Systems (United States)
A. J. Nico, Litton Electro-Optical Systems (United States)
Timothy W. Sinor, Litton Electro-Optical Systems (United States)
R. H. Smithson, Litton Electro-Optical Systems (United States)

Published in SPIE Proceedings Vol. 3749:
18th Congress of the International Commission for Optics
Alexander J. Glass; Joseph W. Goodman; Milton Chang; Arthur H. Guenther; Toshimitsu Asakura, Editor(s)

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