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Proceedings Paper

Light scattering by rough dielectric surface: antireflection effect and nonlinear-optical characterization of the roughness
Author(s): Anastasia S. Gruzdeva; Vitali E. Gruzdev
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Paper Abstract

Computational modeling of light scattering at dielectric surface with sine and random roughness has allowed to calculate space distribution of both transmitted and reflected scattered waves, dependence of their amplitudes on roughness amplitude and period in case of sine roughness. Obtained results show possibility of antireflection effect. On the other hand, possibility to use nonlinear laser- induced variations of refraction index for roughness characterization is shown too.

Paper Details

Date Published: 19 July 1999
PDF: 2 pages
Proc. SPIE 3749, 18th Congress of the International Commission for Optics, (19 July 1999); doi: 10.1117/12.354944
Show Author Affiliations
Anastasia S. Gruzdeva, S.I. Vavilov State Optical Institute (Russia)
Vitali E. Gruzdev, S.I. Vavilov State Optical Institute (Russia)


Published in SPIE Proceedings Vol. 3749:
18th Congress of the International Commission for Optics
Alexander J. Glass; Joseph W. Goodman; Milton Chang; Arthur H. Guenther; Toshimitsu Asakura, Editor(s)

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