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Proceedings Paper

Phase-shift error calibration in modulation measurement profilometry
Author(s): Likun Su; Wansong Li; Xianyu Su; Liqun Xiang
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Paper Abstract

Modulation value play a significant role in Modulation Measurement Profilometry. By projection sinusoidal fringe on an object, then shift the sinusoidal grating in one period L(L >= 3) times with equal interval, we can calculate the modulation distribution on the object with these L frames of the fringe pattern. Incorrect modulation can arise when phase-shift error exist. In this paper we give out the general expression of modulation calculation for any phase- shift interval with least-square method when L equals 5. The result proved that the calibration is necessary and useful when phase-shift error exist.

Paper Details

Date Published: 19 July 1999
PDF: 2 pages
Proc. SPIE 3749, 18th Congress of the International Commission for Optics, (19 July 1999); doi: 10.1117/12.354877
Show Author Affiliations
Likun Su, Sichuan Univ. (China)
Wansong Li, Sichuan Univ. (China)
Xianyu Su, Sichuan Univ. (China)
Liqun Xiang, Sichuan Univ. (China)


Published in SPIE Proceedings Vol. 3749:
18th Congress of the International Commission for Optics
Alexander J. Glass; Joseph W. Goodman; Milton Chang; Arthur H. Guenther; Toshimitsu Asakura, Editor(s)

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