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Proceedings Paper

Scanning near-field optical microscopy: local probes and enhanced electromagnetic fields
Author(s): L. Aigouy; Albert Claude Boccara; S. Ducourtieux; S. Gresillon; Jean-Claude Rivoal; Haim Cory; Patrice Gadenne; Vladimir M. Shalaev
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Paper Abstract

Enhanced electromagnetic fields are investigated, both theoretically and experimentally, on two model systems using high spatial resolution. Strong field enhancements at the apex of a tungsten tip illuminated by an external light source are studied as a function of the incident polarization. The surface of percolating random metal- dielectric films consist of several spectral resonances, which have been calculated and are observed here in near field with 10 nm lateral resolution.

Paper Details

Date Published: 19 July 1999
PDF: 2 pages
Proc. SPIE 3749, 18th Congress of the International Commission for Optics, (19 July 1999); doi: 10.1117/12.354851
Show Author Affiliations
L. Aigouy, ESPCI and Univ. de Paris VI--Pierre et Marie Curie (France)
Albert Claude Boccara, ESPCI and Univ. de Paris VI--Pierre et Marie Curie (France)
S. Ducourtieux, ESPCI and Univ. de Paris VI--Pierre et Marie Curie (France)
S. Gresillon, ESPCI and Univ. de Paris VI--Pierre et Marie Curie (France)
Jean-Claude Rivoal, ESPCI and Univ. de Paris VI--Pierre et Marie Curie (France)
Haim Cory, Technion--The Institute for Physical and Chemical Research (Israel)
Patrice Gadenne, LMOV (France)
Vladimir M. Shalaev, New Mexico State Univ. (United States)


Published in SPIE Proceedings Vol. 3749:
18th Congress of the International Commission for Optics
Alexander J. Glass; Joseph W. Goodman; Milton Chang; Arthur H. Guenther; Toshimitsu Asakura, Editor(s)

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