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Proceedings Paper

Very wide dynamic range SWIR sensors for very low background applications
Author(s): Robert F. Cannata; Randal J. Hansen; Adrienne N. Costello; William J. Parrish
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Paper Abstract

This paper describes a high performance 320 by 256 readout integrated circuit (ROIC) designed for P-on-N short wave IR (SWIR) detectors including InGaAs and HgCdTe, which also has the ability to operate at low input current levels with N- on-P detectors. The ROIC/FPA will support a wide range of system requirements from very low background applications to daytime high illumination conditions. To accommodate the wide scene dynamic range requirements, two selectable integration capacitors are used to control the input circuit transimpedance gain. A 10fF integration capacitor is used for low noise and low flux levels down to 10-5 ft Lambert, corresponding to approximately 2 X 1010 ph/cm2-sec for 0.9 micrometers to 1.7 micrometers spectral band using f/1.5 optics, assuming a 2856 Kelvin blackbody distribution. For higher flux levels, a 0.21pF integration capacitor can be selected, thus providing over a factor of 20 dynamic range. A capacitive feedback transimpendance amplifier provides a low noise detector interface circuit capable of operating at low input currents without frame-to- frame image lag. A sample and hold capacitor is also part of the input unit cell architecture, which allows the FPA to be operated in full frame snapshot mode and provides the maximum integration time available. The integration time is electronically controlled by an external clock pulse, and is adjustable form 0.5microsecond(s) ec to approximately the frame time of 33.3 msec for 30Hz operation. This produces an additional factor of 66,000 to the total nine orders of magnitude in scene dynamic range.

Paper Details

Date Published: 26 July 1999
PDF: 10 pages
Proc. SPIE 3698, Infrared Technology and Applications XXV, (26 July 1999); doi: 10.1117/12.354576
Show Author Affiliations
Robert F. Cannata, Indigo Systems Corp. (United States)
Randal J. Hansen, Indigo Systems Corp. (United States)
Adrienne N. Costello, Indigo Systems Corp. (United States)
William J. Parrish, Indigo Systems Corp. (United States)


Published in SPIE Proceedings Vol. 3698:
Infrared Technology and Applications XXV
Bjorn F. Andresen; Marija Strojnik, Editor(s)

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