Share Email Print

Proceedings Paper

Future characterization needs for optical materials
Author(s): Michael E. Thomas; William J. Tropf
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Optical material characterization encompasses absorption, refraction and scattering phenomena as a function of frequency and temperature. The level of knowledge of the optical constants for most optical materials is sparse, especially at temperatures outside of room temperature. Critical future applications will require a more complete database. The need for greater precision in the optical constants requires both improved experimental techniques and more detailed modes. Since a comprehensive experimental database is impossible, physically-based models, allowing accurate interpolation and extrapolation, are an essential part of optical characterization. Furthermore, most optical constant characterization is reported in the frequency- domain. However, high-speed optoelectronic materials require time-domain characterization.

Paper Details

Date Published: 26 July 1999
PDF: 12 pages
Proc. SPIE 3698, Infrared Technology and Applications XXV, (26 July 1999); doi: 10.1117/12.354566
Show Author Affiliations
Michael E. Thomas, Johns Hopkins Univ. (United States)
William J. Tropf, Johns Hopkins Univ. (United States)

Published in SPIE Proceedings Vol. 3698:
Infrared Technology and Applications XXV
Bjorn F. Andresen; Marija Strojnik, Editor(s)

© SPIE. Terms of Use
Back to Top