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Proceedings Paper

Theoretical basis and experimental confirmation: why a CMOS imager is superior to a CCD
Author(s): Lester J. Kozlowski; David L. Standley; Jiafu Luo; Alfredo Tomasini; Anthony M. Gallagher; R. Mann; B. C. Hsieh; T. Liu; William E. Kleinhans
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Paper Abstract

Sub-micron CMOS has already enabled the development of IR focal plane array with ultra-low read noise and high sensitivity for many demanding applications. The successful monolithic integration of silicon photo detector with low- noise pixel-based amplifiers in fine pixel pitch via modern CMOS technology now suggests the imminent obsolescence of CCDs and photographic film for consumer uses. Specifically, we report the achievement of < 20 e- read noise at high data rates and video frame rate,s the confirmation of the fundamental superiority of the CMOS imager for visible imaging, and approximately 2X reduction in kTC noise without invoking classical correlated double sampling techniques. These suggest a strong likelihood reduction in kTC noise without invoking classical correlated double sampling techniques. These suggest a strong likelihood that the CCDs long reign is coming to an end.

Paper Details

Date Published: 26 July 1999
PDF: 9 pages
Proc. SPIE 3698, Infrared Technology and Applications XXV, (26 July 1999); doi: 10.1117/12.354540
Show Author Affiliations
Lester J. Kozlowski, Rockwell Science Ctr. (United States)
David L. Standley, Rockwell Science Ctr. (United States)
Jiafu Luo, Rockwell Science Ctr. (United States)
Alfredo Tomasini, Rockwell Science Ctr. (United States)
Anthony M. Gallagher, Rockwell Science Ctr. (United States)
R. Mann, Conexant Systems, Inc. (United States)
B. C. Hsieh, Conexant Systems, Inc. (United States)
T. Liu, Valley Oak Semiconductor, Inc. (United States)
William E. Kleinhans, Valley Oak Semiconductor, Inc. (United States)


Published in SPIE Proceedings Vol. 3698:
Infrared Technology and Applications XXV
Bjorn F. Andresen; Marija Strojnik, Editor(s)

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