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Proceedings Paper

Advances in amorphous silicon uncooled IR systems
Author(s): John F. Brady; Thomas R. Schimert; David D. Ratcliff; Roland W. Gooch; Bobbi Ritchey; P. McCardel; K. Rachels; Steven J. Ropson; Marty Wand; M. Weinstein; John Wynn
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Paper Abstract

A new class of uncooled IR systems has been developed based on advances in both amorphous silicon detectors and signal/system processing techniques. Not only are these devices uncooled but they operate over a wide system ambient temperature range without the use of TEC's or choppers. The devices are DC biased and provide radiometric information from each pixel without the use of a calibrated source. The current imaging system are medium to low resolution. They were designed with a very disciplined 'concept-to-cost' technique in which cost, power, sizes, weight and performance were traded off in the stated order. The result has been a new generation of 'ambient temperature' thermal imaging system and radiometers.

Paper Details

Date Published: 26 July 1999
PDF: 7 pages
Proc. SPIE 3698, Infrared Technology and Applications XXV, (26 July 1999); doi: 10.1117/12.354517
Show Author Affiliations
John F. Brady, Raytheon Systems Co. (United States)
Thomas R. Schimert, Raytheon Systems Co. (United States)
David D. Ratcliff, Raytheon Systems Co. (United States)
Roland W. Gooch, Raytheon Systems Co. (United States)
Bobbi Ritchey, Raytheon Systems Co. (United States)
P. McCardel, Raytheon Systems Co. (United States)
K. Rachels, Raytheon Systems Co. (United States)
Steven J. Ropson, Raytheon Systems Co. (United States)
Marty Wand, Raytheon Systems Co. (United States)
M. Weinstein, Raytheon Systems Co. (United States)
John Wynn, Raytheon Systems Co. (United States)


Published in SPIE Proceedings Vol. 3698:
Infrared Technology and Applications XXV
Bjorn F. Andresen; Marija Strojnik, Editor(s)

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