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Proceedings Paper

8- to 9-um and 14- to 15-um two-color 640x486 GaAs/AlGaAs quantum well infrared photodetector (QWIP) focal plane array camera
Author(s): Sarath D. Gunapala; Sumith V. Bandara; Anjali Singh; John K. Liu; S. B. Rafol; Edward M. Luong; Jason M. Mumolo; N. Q. Tran; John David Vincent; C. A. Shott; James F. Long; Paul D. LeVan
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Paper Abstract

An optimized long-wavelength two-color quantum well IR photodetector (QWIP) device structure has been designed. This device structure was grown on a three-inch semi- insulating GaAs substrate by molecule beam epitaxy (MBE). This wafer was processed into several 640 X 486 format monolithically integrated 8-9 and 14-15 micrometers two-color QWIP focal plane arrays (FPAs). These FPAs were then hybridized to 640 X 486 silicon CMOS readout multiplexers. A thinned FPA hybrid was integrated into a liquid helium cooled dewar to perform electrical and optical characterization and to demonstrate simultaneous two-color imagery. The 8-9 micrometers detectors in the FPA have shown background limited performance (BLIP) at 70 K operating temperature, at 300 K background with f/2 cold stop. The 14-15 micrometers detectors of the FPA have reached BLIP at 40 K operating temperature at the same background conditions. In this paper we discuss the performance of this long-wavelength dualband QWIP FPA in quantum efficiency, detectivity, noise equivalent temperature difference, uniformity, and operability.

Paper Details

Date Published: 26 July 1999
PDF: 11 pages
Proc. SPIE 3698, Infrared Technology and Applications XXV, (26 July 1999); doi: 10.1117/12.354502
Show Author Affiliations
Sarath D. Gunapala, Jet Propulsion Lab. (United States)
Sumith V. Bandara, Jet Propulsion Lab. (United States)
Anjali Singh, Air Force Research Lab. (United States)
John K. Liu, Jet Propulsion Lab. (United States)
S. B. Rafol, Jet Propulsion Lab. (United States)
Edward M. Luong, Jet Propulsion Lab. (United States)
Jason M. Mumolo, Jet Propulsion Lab. (United States)
N. Q. Tran, Jet Propulsion Lab. (United States)
John David Vincent, Raytheon Infrared Ctr. of Excellence (United States)
C. A. Shott, Raytheon Infrared Ctr. of Excellence (United States)
James F. Long, Raytheon Infrared Ctr. of Excellence (United States)
Paul D. LeVan, Air Force Research Lab. (United States)


Published in SPIE Proceedings Vol. 3698:
Infrared Technology and Applications XXV
Bjorn F. Andresen; Marija Strojnik, Editor(s)

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