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Proceedings Paper

Embedded cure monitor, strain gauge, and mechanical state estimator
Author(s): Joel Dubow; Wenjia Zhang; Yijang Lu; Jeremy Bingham; F. Syammach; Donald G. Krantz; John H. Belk; Paul J. Biermann; Ramesh Harjani; Susan C. Mantell; Dennis L. Polla; Philip R. Troyk
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Paper Abstract

Pressed PZT Piezoelectric disks were embedded in a range of materials and their properties monitored under a wide range of conditions. The output depends on the temperature and pressure exerted on the PZT by the surrounding material and by the mechanical impedance mismatch between the embedded PZT and the surroundings. By monitoring the `Q' of the PZT (the ratio of energy stored to energy dissipated) it was found that the PZT discs could be used as cure monitors, strain gauges, and as embedded dynamic mechanical property estimators. This latter property is a means of gauging the `health of the material', and its degradation with time. These sensors were part of the MTS/US Navy embedded sensor program, so the sensors could be addressed and read remotely. The techniques, the data and the applications are discussed in this paper.

Paper Details

Date Published: 20 July 1999
PDF: 15 pages
Proc. SPIE 3673, Smart Structures and Materials 1999: Smart Electronics and MEMS, (20 July 1999); doi: 10.1117/12.354288
Show Author Affiliations
Joel Dubow, Univ. of Utah (United States)
Wenjia Zhang, Univ. of Utah (United States)
Yijang Lu, Univ. of Utah (United States)
Jeremy Bingham, Univ. of Utah (United States)
F. Syammach, Univ. of Utah (United States)
Donald G. Krantz, MTS Systems Corp. (United States)
John H. Belk, Boeing Co. (United States)
Paul J. Biermann, Johns Hopkins Univ. (United States)
Ramesh Harjani, Univ. of Minnesota/Twin Cities (United States)
Susan C. Mantell, Univ. of Minnesota/Twin Cities (United States)
Dennis L. Polla, Univ. of Minnesota/Twin Cities (United States)
Philip R. Troyk, Illinois Institute of Technology (United States)


Published in SPIE Proceedings Vol. 3673:
Smart Structures and Materials 1999: Smart Electronics and MEMS
Vijay K. Varadan, Editor(s)

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