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Proceedings Paper

Analysis of diffraction processes in gratings
Author(s): Pavel Fiala; Ivan Richter; Zbynek Ryzi
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Paper Abstract

This paper concentrates on theoretical studies of diffraction process in periodic diffractive structures-- gratings. Its contribution can be seen on several levels: it reviews the terminology and different approaches of diffraction methods, presents a new form of diffraction process characterization (described by the diffraction efficiency), and discusses five regions with typical diffraction regimes. In more detail, this contribution analyses the mechanisms during the diffraction process in terms of phase synchronisms, and distinguishes between angular, transversal and Bragg (volume) phase synchronisms. Using such terminology, diffraction regions are discussed in more detail. The case of Bragg diffraction is treated by both an approximate (Kogelnik's method) and a rigorous method (rigorous coupled-wave analysis-RCWA), and these two methods are compared. Properties of high-spatial frequency gratings are summarized, and resonant regions, characterized by strong resonant processes, are introduced. Finally, three different methods for the analysis of diffraction gratings are reviewed: RCWA, Kogelnik's approximate method, and approximate methods of transmittance function. The review of basic transmittance methods is made (primitive, modified), and a different approach (TCWA-transmittance coupled-wave analysis) is presented.

Paper Details

Date Published: 14 July 1999
PDF: 12 pages
Proc. SPIE 3820, 11th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, (14 July 1999); doi: 10.1117/12.353051
Show Author Affiliations
Pavel Fiala, Czech Technical Univ./Prague (Czech Republic)
Ivan Richter, Czech Technical Univ./Prague (Czech Republic)
Zbynek Ryzi, Czech Technical Univ./Prague (Czech Republic)

Published in SPIE Proceedings Vol. 3820:
11th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics
Miroslav Hrabovsky; Anton Strba; Waclaw Urbanczyk, Editor(s)

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