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Proceedings Paper

Imaging artifacts due to pixel spatial sampling smear and amplitude quantization in two-dimensional visible imaging arrays
Author(s): Terrence S. Lomheim; Jeffrey D. Kwok; Tracy E. Dutton; Ralph M. Shima; Jerris F. Johnson; Richard H. Boucher; Christopher J. Wrigley
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Paper Abstract

In this paper, we studied the imaging effects of pixel spatial-sampling and scan-velocity mismatch in 2D visible image sensors. these effects were examined experimentally by projecting bar pattern sequences of varying spatial frequency on two different devices and by comparing their outputs with the results of a corresponding imaging simulation. Beat patterns and aliased spatial frequencies were observed by imaging the bar pattern sequences onto an area CMOS `active pixel' sensor. Image phase reversal effects were observed by inducing a systematic mismatch between the scan velocity of a bar pattern `sunburst' areal image and the corresponding velocity of the clocked image charge in a time-delay-and-integration CCD image sensor. The visual image effects of an analog-to-digital converter's (ADC) pixel amplitude quantization, specifically integral nonlinearity (INL) and differential nonlinearity (DNL) were studied using two very different input images. The INL and DNL patterns, obtained from measurements on a 14-bit, video ADC were scaled and then imbedded in the response characteristics of these two images. Various scaling of these INL and DNL patterns were used. the results obtained show artifacts varying in impact from insignificant to clearly degrading.

Paper Details

Date Published: 12 July 1999
PDF: 25 pages
Proc. SPIE 3701, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing X, (12 July 1999); doi: 10.1117/12.352987
Show Author Affiliations
Terrence S. Lomheim, The Aerospace Corp. (United States)
Jeffrey D. Kwok, U.S. Air Force SMC/CIE (United States)
Tracy E. Dutton, The Aerospace Corp. (United States)
Ralph M. Shima, The Aerospace Corp. (United States)
Jerris F. Johnson, The Aerospace Corp. (United States)
Richard H. Boucher, The Aerospace Corp. (United States)
Christopher J. Wrigley, Jet Propulsion Lab. (United States)

Published in SPIE Proceedings Vol. 3701:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing X
Gerald C. Holst, Editor(s)

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