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Proceedings Paper

Measurement of the wideband infrared scene projector (WISP) radiometric and thermal resolution
Author(s): James R. Kircher; Steven Arthur Marlow; Thomas P. Bergin; W. Larry Herald
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Paper Abstract

The third generation of the Wide-band Infrared Scene Projector (WISP) resistor arrays has been delivered to the Air Force Research Laboratory's Kinetic Kill Vehicle Hardware-in-the-Loop Simulation facility. A critical parameter in determining the extent with which the thermal arrays simulate the real world is the radiometric and thermal resolution. The measurement of the resolution is dependent upon several factors including the input data word resolution, drive electronics resolution, system noise factors, and the measurement sensor. Several measurements were made to quantify the noise components of the WISP array and the measurement sensor to determine the limiting factor for the measurements. Due to the nonlinear transfer function between the command voltage and the projected radiance, measurements were made at several input levels to determine how the resolution varies as a function of command voltage level. Measurements were performed both with and without the spatial non-uniformity correction (NUC) applied to determine the impact of the NUC on the radiometric resolution. Based on the results of these measurements the resolution of the WISP arrays is defined in both radiometric and thermal units.

Paper Details

Date Published: 19 July 1999
PDF: 12 pages
Proc. SPIE 3697, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV, (19 July 1999); doi: 10.1117/12.352905
Show Author Affiliations
James R. Kircher, Science Applications International Corp. (United States)
Steven Arthur Marlow, Seeker Technologies Inc. (United States)
Thomas P. Bergin, Seeker Technologies Inc. (United States)
W. Larry Herald, Computer Sciences and Applications, Inc. (United States)


Published in SPIE Proceedings Vol. 3697:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV
Robert Lee Murrer, Editor(s)

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