Share Email Print
cover

Proceedings Paper

Application of multiple IR projector technologies for AMCOM HWIL simulations
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper describes the application of multiple IR projector technologies to hardware-in-the-loop (HWIL) simulations at the US Army Aviation and Missile Command's (AMCOM) Missile Research, Development, and Engineering Center (MRDEC). Several projectors utilizing a variety of emerging technologies are currently being successfully applied within the HWIL facilities of AMCOM's MRDEC. Projector technologies utilized at AMCOM include laser diode array projectors, Honeywell's bright resistive infrared thermal emitter arrays, an IR zoom projector with thermoscenes, and steerable point source projectors. Future plans include a new resistor array projector called the Multispectral Infrared Animation Generation Equipment, which is being manufactured by Santa Barbara Infrared. These projector technologies have been used to support multiple HWIL test entries of various seeker configurations. Seeker configurations tested include: two InSb 256 X 256 FPAs, an InSb 512 X 512 FPA, a PtSi 640 X 480 FPA, a PtSi 256 X 256 FPA, a HgCdTe 256 X 256 FPA, a scanning linear array, and an uncooled 320 X 240 microbolometer FPA. The application, capabilities, and performance of each technology are reviewed in the paper. Example imagery collected from each operational system is also presented.

Paper Details

Date Published: 19 July 1999
PDF: 9 pages
Proc. SPIE 3697, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV, (19 July 1999); doi: 10.1117/12.352902
Show Author Affiliations
D. Brett Beasley, Optical Sciences Corp. (United States)
Daniel A. Saylor, Optical Sciences Corp. (United States)


Published in SPIE Proceedings Vol. 3697:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV
Robert Lee Murrer Jr., Editor(s)

© SPIE. Terms of Use
Back to Top