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Proceedings Paper

Domain structure of poled (111) PZT (PbZr0.25Ti0.75O3) films
Author(s): Christian Erich Zybill; Hussein Boubekeur; Peter Radojkovic; Michael Schwartzkopff; E. Hartmann; Frederick Koch; Gerhard Groos; Bohuslav Rezek; Rainer Bruchhaus; Wolfram Wersing
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Paper Abstract

Domain wall sin ferroelectric tetragonal poled PZT films have been observed by surface corrugation effects. Boundaries between adjacent 90 degree domains show a vertical shrinkage on the surface as result of coherency defects and shear strain at the interface between domains. The vertical truncation of the surface amounts to 1.0-1.5 nm. The wall thickness of 90 degree domains has been estimated to approximately 1 nm. STM allows to detect domains after metallization of the surface with a Cr-Ni or Ti film. AFM measurements with grounded samples provide a detailed picture of the unmetallized PZT surface. Single crystalline areas consists of strictly oriented domains of 10-15 nm width. Domains show long-range ordering effects due to stress in the film. A mean value of domain width can also be obtained by SAXS and amounts to 17.5 nm. Exertion of stress result into an increase of domain thickness by approximately 1 percent. Electrical switching of single crystallites as well as optical effects have been demonstrated.

Paper Details

Date Published: 12 July 1999
PDF: 10 pages
Proc. SPIE 3675, Smart Structures and Materials 1999: Smart Materials Technologies, (12 July 1999); doi: 10.1117/12.352816
Show Author Affiliations
Christian Erich Zybill, Technische Univ. Muenchen (Germany)
Hussein Boubekeur, Technische Univ. Muenchen (Germany)
Peter Radojkovic, Technische Univ. Muenchen (Germany)
Michael Schwartzkopff, Technische Univ. Muenchen (Germany)
E. Hartmann, Technische Univ. Muenchen (Germany)
Frederick Koch, Technische Univ. Muenchen (Germany)
Gerhard Groos, Walter Schottky Institut (Germany)
Bohuslav Rezek, Walter Schottky Institut (Germany)
Rainer Bruchhaus, Siemens AG (Germany)
Wolfram Wersing, Siemens AG (Germany)


Published in SPIE Proceedings Vol. 3675:
Smart Structures and Materials 1999: Smart Materials Technologies
Manfred R. Wuttig, Editor(s)

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