Share Email Print
cover

Proceedings Paper

Magnetic shape memory (MSM) effect in textured polycrystalline Ni2MnGa
Author(s): Yossef Ezer; Alexei Sozinov; Giora Kimmel; V. Etaleaniemi; N. I. Glavatskaya; A. D'Anci; V. Podgursky; Veikko K. Lindroos; Kari Ullakko
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Materials that develop large shape changes in the magnetic field at a short response time provide a new method of producing motion and force in electromechanical devices. The strains are based on the magnetic-field-induced reorientation of the twin variants of the material. This effect is called magnetic shape memory (MSM) effect, because the shape of the material can be controlled by the magnetic field. MSM effect can operate in the martensite phase, and it does not require temperature changes to occur unlike regular shape memory effect (SME). Ni-Mn-Ga alloys and several iron-based alloys are currently being developed by many research groups. In this report, magnetic-field-induced strain of two polycrystalline non-stoichiometric Ni2MnGa alloys with oriented crystal structure were studied during cooling through the martensitic transformation temperature (Ms) and at a constant temperature below Ms. X-ray diffraction measurements confirmed that the origin of the induced strains was the change of the proportions of different twin orientations. Frequency response of the MSM strains in the alloy was shown to be over 5 kHz. One of the present alloys was deposited by laser ablation on a silicon substrate. The thin film exhibits tetragonal lattice structure.

Paper Details

Date Published: 12 July 1999
PDF: 8 pages
Proc. SPIE 3675, Smart Structures and Materials 1999: Smart Materials Technologies, (12 July 1999); doi: 10.1117/12.352795
Show Author Affiliations
Yossef Ezer, ABB Corporate Research (Finland)
Alexei Sozinov, Helsinki Univ. of Technology (Finland)
Giora Kimmel, Ben-Gurion Univ. (Israel)
V. Etaleaniemi, Univ. of Helsinki (Finland)
N. I. Glavatskaya, Helsinki Univ. of Technology (Finland)
A. D'Anci, ABB Corporate Research (Finland)
V. Podgursky, Helsinki Univ. of Technology (Finland)
Veikko K. Lindroos, Helsinki Univ. of Technology (Finland)
Kari Ullakko, Helsinki Univ. of Technology (Finland)


Published in SPIE Proceedings Vol. 3675:
Smart Structures and Materials 1999: Smart Materials Technologies
Manfred R. Wuttig, Editor(s)

© SPIE. Terms of Use
Back to Top