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Proceedings Paper

Formation and observation of ferroelectric domains in PbZr1-xTixO3(PZT) thin films using atomic force microscopy
Author(s): Hyunjung Shin; Kyongmi Lee; Geunbae Lim; Jong up Jeon; Y. Eugene Pak; Seungbum Hong; Kwangsoo No
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Paper Abstract

Very small-sized ferroelectric domains were induced and observed using a modified atomic force microscopy (AFM). Bias voltage between a conductive AFM tip and a sol-gel processed PZT film caused the switching of small ferroelectric domains. ELectrostatic forces between the polarized area and the tip provide the imaging of the polarized small domains. Applying voltage with the opposite sign can depolarize the polarized area and the formation of a series of data dots was demonstrated. In addition, the retention phenomena of micron size domains in PZT films were investigated. The polarized images disappeared within a few days even without an application of voltage - often called the retention loss or failure. An empirical relationship between relaxation time, bit size and poling time is established and verified. Two operative processes for the retention loss are either the stray charge accumulation on the polarized surfaces or the stress relaxation of the piezoelectric films. An effective way of improving the retention characteristics is suggested. The experimental results obtained in this study provide substantial insight into the mechanism for the retention failure of the polarized domains as well as the polarization behavior in PZT films with a nanometer scale.

Paper Details

Date Published: 12 July 1999
PDF: 9 pages
Proc. SPIE 3675, Smart Structures and Materials 1999: Smart Materials Technologies, (12 July 1999); doi: 10.1117/12.352782
Show Author Affiliations
Hyunjung Shin, Samsung Advanced Institute of Technology (South Korea)
Kyongmi Lee, Samsung Advanced Institute of Technology (South Korea)
Geunbae Lim, Samsung Advanced Institute of Technology (South Korea)
Jong up Jeon, Samsung Advanced Institute of Technology (South Korea)
Y. Eugene Pak, Samsung Advanced Institute of Technology (South Korea)
Seungbum Hong, Korea Advanced Institute of Science and Technology (South Korea)
Kwangsoo No, Korea Advanced Institute of Science and Technology (South Korea)


Published in SPIE Proceedings Vol. 3675:
Smart Structures and Materials 1999: Smart Materials Technologies
Manfred R. Wuttig, Editor(s)

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