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Proceedings Paper

Optical nanoprobes for SNOM based on laser technology
Author(s): Vadim P. Veiko; Nikolay B. Voznesensky; Igor B. Smirnov; Alexey I. Kalachev; Dmitry I. Ivanitski; Juriy M. Voronin; Michael Wolf; Krassimira Meteva
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Paper Abstract

Optics with resolution within the wavelength - scanning near-field optical microscopy - is highly important science field nowadays. Main parameters of the SNOM - resolution, contrast, energetic efficiency are defined by optical probes characteristics: aperture size or curvature radius of the sharp, geometry, material, etc. Fabrication and testing of optical probes in nanometric scale of size are described in the paper. For fabrication of near-field probes the laser many-steps drawing and chemical etching of single- and multimode optical fibers is realized. Investigation of far- field light distribution and theoretical reconstruction of near field carried out the testing of probes.

Paper Details

Date Published: 15 July 1999
PDF: 8 pages
Proc. SPIE 3618, Laser Applications in Microelectronic and Optoelectronic Manufacturing IV, (15 July 1999); doi: 10.1117/12.352709
Show Author Affiliations
Vadim P. Veiko, St. Petersburg Institute of Fine Mechanics and Optics (Russia)
Nikolay B. Voznesensky, St. Petersburg Institute of Fine Mechanics and Optics (Russia)
Igor B. Smirnov, St. Petersburg Institute of Fine Mechanics and Optics (Russia)
Alexey I. Kalachev, St. Petersburg Institute of Fine Mechanics and Optics (Russia)
Dmitry I. Ivanitski, St. Petersburg Institute of Fine Mechanics and Optics (Russia)
Juriy M. Voronin, S.I. Vavilov State Optical Institute (Russia)
Michael Wolf, Bremen Institute for Applied Beam Technology (Germany)
Krassimira Meteva, Bremen Institute for Applied Beam Technology (Germany)


Published in SPIE Proceedings Vol. 3618:
Laser Applications in Microelectronic and Optoelectronic Manufacturing IV
Jan J. Dubowski; Henry Helvajian; Ernst-Wolfgang Kreutz; Koji Sugioka, Editor(s)

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