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Proceedings Paper

Passive scene-based nonuniformity correction in scanning forward-looking infrared sensors
Author(s): James A. Harder
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Paper Abstract

The performance of modern infrared sensors is more likely to be limited by residual non-uniformity artifacts in the imagery, than by the performance of individual elements in the focal plane array. A highly effective method of achieving passive scene based non-uniformity correction in scanning forward-looking infrared sensors is described. A single optical element located in the afocal provides gain, offset and clamping functions on a continuous basis. It offers many advantages over current active and passive non- uniformity correction mechanisms. Several devices have been built and demonstrated.

Paper Details

Date Published: 2 July 1999
PDF: 8 pages
Proc. SPIE 3787, Optical Scanning: Design and Application, (2 July 1999); doi: 10.1117/12.351648
Show Author Affiliations
James A. Harder, Lockheed Martin Electronics & Missiles (United States)

Published in SPIE Proceedings Vol. 3787:
Optical Scanning: Design and Application
Leo Beiser; Stephen F. Sagan; Gerald F. Marshall, Editor(s)

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