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Proceedings Paper

Noncontact point spectroscopy guided by two-channel fluorescence imaging in a hamster cheek pouch model
Author(s): Victor X.D. Yang; Jenny Yeow; Lothar D. Lilge; James Kost; Thomas S. Mang; Brian C. Wilson
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Paper Abstract

A system for in vivo, fluorescence image-guided, non-contact point fluorescence spectroscopy is presented. A 442 nm HeCd laser is used as the fluorescence excitation source. An intensified CCD serves as the detector for both imaging and spectroscopy, on which two regions of 300 X 300 pixels were used for green (500 +/- 18 nm) and red (630 +/- 18 nm) imaging channels, and a strip of 600 X 120 pixels are used for emission spectroscopy (450 - 750 nm). At a working distance of 40 mm, the system has a spatial resolution of 0.16 mm and a spectral resolution of 5 nm. System performance is demonstrated in a carcinogenesis model in hamsters, where tumors were induced by painting DMBA in the cheek pouch. Autofluorescence and Photofrin-induced fluorescence measurements were performed every 2 weeks during the 18 weeks of tumor induction. Punch biopsies on selected animals were taken for histological staging. The results show that autofluorescence fluorescence can distinguish dysplasia from normal mucosal tissue model, utilizing the peak red intensity (or the red-to-green intensity ratio). Photofrin-induced fluorescence was superior to autofluorescence for differentiating high grade dysplasia from invasive cancer.

Paper Details

Date Published: 9 July 1999
PDF: 7 pages
Proc. SPIE 3595, Biomedical Diagnostic, Guidance, and Surgical-Assist Systems, (9 July 1999); doi: 10.1117/12.351517
Show Author Affiliations
Victor X.D. Yang, Ontario Cancer Institute (Canada)
Jenny Yeow, Univ. of Toronto (Canada)
Lothar D. Lilge, Ontario Cancer Institute (Canada)
James Kost, Ontario Cancer Institute (Canada)
Thomas S. Mang, SUNY/Buffalo (United States)
Brian C. Wilson, Ontario Cancer Institute (Canada)


Published in SPIE Proceedings Vol. 3595:
Biomedical Diagnostic, Guidance, and Surgical-Assist Systems
Tuan Vo-Dinh; Warren S. Grundfest; David A. Benaron; Steven T. Charles; Richard D. Bucholz; Michael W. Vannier, Editor(s)

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