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Proceedings Paper

Transmission measurements of the third-order susceptibility of gold
Author(s): David D. Smith; Yongkwon Yoon; Robert W. Boyd; Curtis E. Banks; Mark Steven Paley
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Paper Abstract

Gold nanoparticle composites are known to display large optical nonlinearities. In order to assess the validity of generalized effective medium theories (EMTs) for describing the optical properties of metal nanoparticle composites, we have used the z-scan technique to measure the third-order susceptibility of gold nanoparticle composites across the entire range of fill fractions. These materials range from low concentration statistically random gold sols, to aggregated thin (two-dimensional) composite films, to quasi-bulk thin films above the percolation threshold. These measurements allow the nonlinearity of gold to be determined both directly and by deduction from applicable effective medium theories. We compare our results with predictions which ascribe the nonlinear response to a Fermi-smearing mechanism. We demonstrate that the nonlinear susceptibility changes sign due to a phase shift between the applied field and the local field, and that this sign change occurs at the percolation threshold. Further for films whose thickness is less than an optical wavelength we introduce a 2D form of the Maxwell Garnett model.

Paper Details

Date Published: 28 June 1999
PDF: 10 pages
Proc. SPIE 3793, Operational Characteristics and Crystal Growth of Nonlinear Optical Materials, (28 June 1999); doi: 10.1117/12.351400
Show Author Affiliations
David D. Smith, NASA Marshall Space Flight Ctr. (United States)
Yongkwon Yoon, The Institute of Optics/Univ. of Rochester (United States)
Robert W. Boyd, The Institute of Optics/Univ. of Rochester (United States)
Curtis E. Banks, NASA Marshall Space Flight Ctr. (United States)
Mark Steven Paley, Universities' Space Research Association (United States)


Published in SPIE Proceedings Vol. 3793:
Operational Characteristics and Crystal Growth of Nonlinear Optical Materials
Ravindra B. Lal; Donald O. Frazier, Editor(s)

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